Market Overview:
The technology allows users to obtain electrical measurements of small devices and minute amounts of materials. These devices could include magnetoelectronic/spintronic devices and high-impedance devices, for instance a metallic single-walled carbon-nanotube (mSWNT), a SWNT transistor, a minimum-size deep-submicron metal-oxide semiconductor (MOS) field-effect-transistor (FET), a sub-micron MOS FET that is operating in sub-threshold region, and a molecular device. Other materials of measurement interest may include on-chip biofluids, chemicals, and thin films.
Applications:
· Micro/Nano electronics characterization
· Biosensing applications
· Diagnostic devices
Benefits:
· Increased measurement precision capability
· Potential earlier detection
· Less material needed for measurement
Inventors: P. Wang, C. Song
Protection Status: Patent issued; # 7,724,005
Licensing Status: Available for licensing
Additional Terms: Micro-electronics, Nano-electronics, Biosensing, Diagnostic, Carbon nanotubes
CURF Ref No: 07-036
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